Effect of plasma process on n-GaN surface probed with electrochemical short loop
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9M ago
Effect of plasma process on n-GaN surface probed with electrochemical short loop ..read more
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Estimation of remaining useful lifetime of power electronic components with machine learning based on mission profile data
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11M ago
Estimation of remaining useful lifetime of power electronic components with machine learning based on mission profile data ..read more
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Lifetime model adjustments for GaN cascodes as a base for inverter lifetime estimation
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1y ago
Lifetime model adjustments for GaN cascodes as a base for inverter lifetime estimation ..read more
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Hybrid model to evaluate the frequency-dependent leakage inductance of partially-filled transformers
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1y ago
Hybrid model to evaluate the frequency-dependent leakage inductance of partially-filled transformers ..read more
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Characterization of the novel ICeGaN 650V/ 8.5 A, 200 mΩ power device technology
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1y ago
Characterization of the novel ICeGaN 650V/ 8.5 A, 200 mΩ power device technology ..read more
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Growth of p-type GaN – The role of oxygen in activation of Mg-doping
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1y ago
Growth of p-type GaN – The role of oxygen in activation of Mg-doping ..read more
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Maximum Peak Current and Junction-to-ambient Delta-temperature Investigation in GaN FETs Parallel Connection
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1y ago
Maximum Peak Current and Junction-to-ambient Delta-temperature Investigation in GaN FETs Parallel Connection ..read more
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Lifetime modeling of solder joints based on accelerated mechanical testing and Finite Element Analysis
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1y ago
Lifetime modeling of solder joints based on accelerated mechanical testing and Finite Element Analysis ..read more
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Simulation Study of a 650V Hybrid-Channel SiC Trench MOSFET with Improved On-State Performance
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1y ago
Simulation Study of a 650V Hybrid-Channel SiC Trench MOSFET with Improved On-State Performance ..read more
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PECVD SiNxSiNx passivation with more than 8 MV/cm breakdown strength for GaN-on-Si wafer stress management
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1y ago
passivation with more than 8 MV/cm breakdown strength for GaN-on-Si wafer stress management Matthias Moser, ... Joachim N. Burghartz ..read more
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