Springer » Journal of Electronic Materials
Springer » Journal of Electronic Materials
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The Journal of Electronic Materials is a peer-reviewed scientific journal of The Minerals, Metals & Materials Society (TMS), with a long history of 50 years. The journal reports on the science and technology of electronic materials, while examining new applications of various materials.
The Reliability Impact of Bi Doping on the HfO2 Charge-Trapping Layer: A First-Principles Study
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Spin Splitting and Band Gap Structure in Si[110] Nanowires Doped with Impurities
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5d ago
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Numerical Investigation of a Highly Efficient Hole Transport Layer-Free Solid-State Dye-Sensitized Solar Cell Based on N719 Dye
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5d ago
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Investigation of Structure and Performance of Cerium-Doped Lanthanum Fluoride Nanocrystals for Scintillators
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5d ago
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Effect of Cu Particles on the Properties of Sn-Bi-Pb Low-Melting-Point Alloys
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2w ago
28th International Conference on Nuclear Tracks and Radiation Measurements ..read more
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A Hierarchical NiFe-LDH@CoP Array for High-Efficiency Alkaline Seawater Oxidation
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2w ago
28th International Conference on Nuclear Tracks and Radiation Measurements ..read more
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Highly Flexible, Selective and Sensitive Ammonia Sensor Based on MXene/Cellulose Nanofibers
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2w ago
28th International Conference on Nuclear Tracks and Radiation Measurements ..read more
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Preparation and Properties of Carbonyl Iron/Fe+2Fe2+3O4 with Oxidation Blackening
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2w ago
28th International Conference on Nuclear Tracks and Radiation Measurements ..read more
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A Multifunctional Lead-Free Ferroelectric Transparent Ceramic (K0.5Na0.5)NbO3 Modified by Sr(Bi0.5Nb0.5)O3 with High Transmittance
Springer » Journal of Electronic Materials
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3w ago
Topical Collection: Reliability and Stress-Related Phenomena in Nanoelectronics 2023 ..read more
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A New Method for Evaluating the Influence of Coatings on the Strength and Fatigue Behavior of Flexible Glass
Springer » Journal of Electronic Materials
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3w ago
Topical Collection: Reliability and Stress-Related Phenomena in Nanoelectronics 2023 ..read more
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