OMNIVISION Unveils New Global Shutter Sensors for Machine Vision Applications
Metrology.News
by Keith Mills Publishing Editor
18h ago
OMNIVISION, a leading global developer of semiconductor solutions, including advanced digital imaging, analog, and touch & display technology, has announced two new CMOS global shutter (GS) image sensors for machine vision applications. OMNIVISION has created a new Machine Vision Unit, which will focus on creating innovative solutions for industrial automation, robotics, logistics barcode scanners and intelligent transportation systems The post OMNIVISION Unveils New Global Shutter Sensors for Machine Vision Applications appeared first on Metrology and Quality News - On ..read more
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Aberlink Launch Collimated Lightbox For Optical CMM Inspection
Metrology.News
by Keith Mills Publishing Editor
2d ago
Aberlink’s CCD Camera option for its cartesian CMM range has been significantly improved with the launch of a fully automated and motorized collimated lightbox. Having a 300 x 300mm X-Y measuring range, the collimated light solution enables intricate turned parts to be measured with outstanding accuracy. The post Aberlink Launch Collimated Lightbox For Optical CMM Inspection appeared first on Metrology and Quality News - Online Magazine ..read more
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Scanning Sensor Offers Small Field of View For Electronics Industry
Metrology.News
by Keith Mills Publishing Editor
2d ago
In the semiconductor industry, it is the smallest details that make the difference between success and failure. With its new 3D sensor from the recently developed XCS series, Automation Technology (AT) is launching a product onto the market that is a real game changer, especially for high-performance applications in the electronics industry. The post Scanning Sensor Offers Small Field of View For Electronics Industry appeared first on Metrology and Quality News - Online Magazine ..read more
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Visometry Twyn 2.2 Becomes Faster and More User-Friendly
Metrology.News
by Keith Mills Publishing Editor
2d ago
The Twyn system, a mobile inspection tool, streamlines quality control processes in industries through intuitive tablet usage. With the release of Twyn version 2.2, intricate measurement tasks are now tackled with heightened efficiency and precision, courtesy of its accelerated and user-friendly workflow. The post Visometry Twyn 2.2 Becomes Faster and More User-Friendly appeared first on Metrology and Quality News - Online Magazine ..read more
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X-ray Imaging Solutions Company Secures King’s Award for Enterprise Innovation
Metrology.News
by Keith Mills Publishing Editor
2d ago
ISDI, an innovator in X-ray imaging solutions, is delighted to announce that His Majesty King Charles III, has approved the UK Prime Minister’s recommendation that ISDI should receive a King’s Award for Enterprise in the Innovation category this year. The post X-ray Imaging Solutions Company Secures King’s Award for Enterprise Innovation appeared first on Metrology and Quality News - Online Magazine ..read more
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Unveiling The Power of Smart Data – Transforming Manufacturing Through Precision Metrology
Metrology.News
by Keith Mills Publishing Editor
3d ago
In the era of Industry 4.0, where data reigns supreme, the concept of 'smart data' has emerged as a beacon of efficiency and insight. As manufacturers navigate through a sea of information generated by their operations, the ability to turn raw data into actionable intelligence has become paramount. The post Unveiling The Power of Smart Data – Transforming Manufacturing Through Precision Metrology appeared first on Metrology and Quality News - Online Magazine ..read more
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Leveraging Active Learning For Visual Inspection
Metrology.News
by Keith Mills Publishing Editor
3d ago
Active learning is a machine learning paradigm that involves the model actively selecting the most informative data points for training, rather than relying solely on randomly chosen samples, with the goal of achieving higher accuracy with fewer labelled examples. In traditional supervised learning, a model is trained on a fixed dataset with pre-labelled examples. However, labelling data can be expensive and time-consuming. The post Leveraging Active Learning For Visual Inspection appeared first on Metrology and Quality News - Online Magazine ..read more
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Splitting Hairs: The Enormous Impact of Micro Measurement
Metrology.News
by Keith Mills Publishing Editor
3d ago
For manufacturers in the western hemisphere, the Center for Precision Metrology (CPM) at UNC Charlotte stands alone as the premier academic research center dedicated to delving into the impacts of these micro measurements. The post Splitting Hairs: The Enormous Impact of Micro Measurement appeared first on Metrology and Quality News - Online Magazine ..read more
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Next-Level QC: Leveraging Nanometrology for Unmatched Quality Assurance
Metrology.News
by Keith Mills Publishing Editor
4d ago
Manufacturers can benefit from the latest breakthrough in nanometrology for quality control, regardless of their industry. One research team’s invention revolutionizes current nano-microscope applications — and is the first suitable for commercial and industrial use. The post Next-Level QC: Leveraging Nanometrology for Unmatched Quality Assurance appeared first on Metrology and Quality News - Online Magazine ..read more
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Subcontract Machine Shop Boosts Efficiency Video Inspection System
Metrology.News
by Keith Mills Publishing Editor
4d ago
The Baty Venture Vision System is an advanced optical measurement system designed to provide precise and accurate inspection of components in various industries. Equipped with powerful optics and intuitive software, the Venture system offers comprehensive measurement capabilities, including dimensional analysis, surface inspection, and defect detection. The post Subcontract Machine Shop Boosts Efficiency Video Inspection System appeared first on Metrology and Quality News - Online Magazine ..read more
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